Model 3400 Multi-Function Tester for MLCC chip arrays offers exceptional test flexibility and performance, with throughput up to 45,000 parts per hour.

The Model 3400 supports up to ten user-programmable test stations that can be factory configured with Cap/DF, Flash, IR PreCharge, IR PreSoak, High or Low Volt IR measurement, or Cross Check tests. Cap/DF tests are performed one element at a time, with all remaining elements connected to guard for the most accurate measurements.

The Cross Check test identifies arrays with internal leakage paths or external termination shorts.

• Patented rolling contacts

• Handles 0306 (0816 metric) to 0612
  (1632 metric) chip sizes

• High throughput - up to 45,000 pph

• Lowest cost-to-test

• Ten user programmable test stations
  with Cap/DF, Flash, high/low volt IR,
  PreCharge, PreSoak and Cross Check

• Offers IR soak time > 1 second at
  normal operating speed